Algorithm-Hardware Co-design

The following is a list of related publications and sub-topics the SEEDER group explores in the area of Algorithm-Hardware Co-design:

  • Hardware Accelerators for Bio-inspired Computation Paradigms
    • Hardware-Software Stack for a Neural Network Hardware Accelerator
    • Neural Network (NN)
      • Hardware/algorithm Co-design of Feed-forward/inference and Learning Algorithms
        • Multi-layer Perceptron (MLP)
        • Artificial Neural Network (ANN)
        • Hierarchical Temporal Memory (HTM)
        • Spiking Neural Network (SNN)
    • Device/circuit/hardware Architectures for Implementing NNs
      • Emerging Electronic Devices
        • Spintronics for Emulating Neuronal Soma
        • RRAM Crossbar Arrays for Emulating Synapses
      • Dendritic Computation
      • Design of High-Bandwidth Memory and Network-on-Chip (NOC)
      • Device/circuit/algorithm Co-design of Learning Algorithms (Supervised/Semi-supervised/Unsupervised/Reinforcement)
  • Boolean and Non-Boolean Computing Schemes
    • A. Sengupta, Z. Al Azim, X. Fong, and K. Roy, “Spin-orbit torque induced spike-timing dependent plasticity,” Appl. Phys. Lett. (APL), vol. 106, iss. 9, 093704, Mar. 2015, doi:10.1063/1.4914111 [PDF]
    • K. Roy, D. Fan, X. Fong, Y. Kim, M. Sharad, S. Paul, S. Chatterjee, S. Bhunia, and S. Mukhopadhyay, “Exploring spin transfer torque devices for unconventional computing,” IEEE J. on Emerging and Selected Topics in Circuits and Systems (JETCAS) vol. 5, no. 1, pp. 5-16, Mar. 2015, doi:10.1109/JETCAS.2015.2405171. Invited Paper [PDF]
  • Analog/stochastic Computation Paradigms
    • A. Ranjan, S. Venkataramani, X. Fong, K. Roy, and A. Raghunathan, “Approximate storage for energy efficient spintronic memories,” in Proc. of IEEE/ACM Design, Automation & Test in Europe (DATE), Mar. 2015, pp. 1-6, doi:10.1145/2744769.2744799 [PDF]
    • R. Venkatesan, S. Venkataramani, X. Fong, K. Roy, and A. Raghunathan, “Spintastic: Spin-based stochastic logic for energy-efficient computing,” in Proc. of IEEE/ACM Design, Automation & Test in Europe (DATE), Mar. 2015, pp. 1575-1578, [PDF]