TOPIC Damage Modeling, Simulation and Identification in Aircraft Structural Health Mornitoring
SPEAKER Associate Professor Mei YUAN

Beihang University, China

DATE 17 Feb 2011 (Thursday)
TIME 10:30 am to 11:30 am
VENUE E4A-04-03, ACT Lab Seminar Room,Engineering block E4A, NUS
FEES No Charge
Aircraft Structural Health Monitoring (A-SHM) is the technology to detect parameters (such as load, stress, strike and damage of aircraft) online by using distributed sensor networks which constructed from various state-of-the-art sensors. SHM can identify and locate the damage, evaluate and prognosticate the structure state through analyzing and processing the signal acquired by the sensors, or through Artificial Intelligence (AI) methods. Researches of the technology of damage modeling, simulation and identification are helpful for promoting airborne SHM level, and are also very important for the safety of aircraft.
Consider the typical structure of aircraft -aircraft wing, much works have been done focus on the key technologies of A-SHM, including structure and damage modeling & simulating, damage identification based on Artificial Intelligence, damage identification based on signal processing, etc. Simulation and experiment results are introduced.
Dr. Yuan Mei was born in Harbin, Heilongjiang Province, China in September, 1967. She received B.S., M.S. and Ph.D. degree from Zhejiang University, China in 1990, Beijing University of Aeronautics and Astronautics (BUAA), China in 1998 and 2010, respectively. After a two-year R&D work at Hangzhou from 1990 to 1992, she joined School of Automation Science and Electric Engineering, Beihang University  (BUAA)  in 1992. Presently, as an associate professor, her research concerns measurement and instrumentation, structural health monitoring technology, intelligent signal processing. She has published about forty papers and three books, three patents and two software copyrights have been authorized.
 Jointly Organized By Edutainment Robotics Lab, ECE, Social Robotics Lab, IDMI, and Singapore IEEE SMC/R&A Chapter